Anglo–American Microelectronics Data 1968–69: Manufacturers by G. W. A. Dummer, J. Mackenzie Robertson

By G. W. A. Dummer, J. Mackenzie Robertson

Anglo-American Microelectronics facts 1968-69, quantity : brands R-Z provides details at the positive factors of the layout, development and alertness of microelectronic units. The booklet discusses the beneficial properties of the layout, development and alertness of radiation built-in circuits; Raytheon built-in circuits; RCA built-in circuits; and Signetics built-in circuits. The textual content additionally describes the positive aspects of the layout, building and alertness of Siliconix built-in circuits; Sperry built-in circuits; Sprague built-in circuits; and STC thick movie circuits. The gains of the layout, development and alertness of Stewart-Warner micro circuits; Sylvania built-in circuits; Texas tools semiconductor networks; and transitron built-in circuits also are encompassed. The e-book extra tackles the good points of the layout, building and alertness of Varo hybrid movie built-in circuits; Welwyn thick movie and skinny movie resistor networks; Westinghouse built-in circuits; and Zeltex hybrid built-in circuits. Designers, dealers, and clients of microelectronic units will locate the e-book important.

Show description

Read or Download Anglo–American Microelectronics Data 1968–69: Manufacturers R–Z PDF

Similar microelectronics books

Vacuum Microelectronics

Specialist assurance of vacuum microelectronics-principles, units, and purposes the sector of vacuum microelectronics has complicated so quickly that advertisement units are being fabricated, and purposes are being built in monitors, instant communications, spacecraft, and electronics to be used in harsh environments.

Software-Implemented Hardware Fault Tolerance

This publication offers the speculation at the back of software-implemented fault tolerance, in addition to the sensible facets had to positioned it to paintings on actual examples. by way of comparing properly the benefits and downsides of the already on hand methods, the ebook presents a consultant to builders prepared to undertake software-implemented fault tolerance of their purposes.

Programming the Intel Edison: Getting Started with Processing and Python

Learn how to simply Create robot, IoT, and Wearable digital instruments! Get up-and-running development state of the art Edison units with aid from this DIY consultant. Programming the Intel Edison: Getting begun with Processing and Python lays out the Edison’s strong positive factors and teaches the fundamentals of Internet-enabled embedded programming.

Additional info for Anglo–American Microelectronics Data 1968–69: Manufacturers R–Z

Example text

These tests are performed periodically on at least one lot of every circuit family produced during that period. If still criteria higher levels of reliability are required, additional can be added nominal cost. to the basic Reliability Program at ,r ~ A RD-209 (Contd) RADIATION INTEGRATED CIRCUITS TYPICAL PERFORMANCE CHARACTERISTICS 1585 Continued RADIATION RD-211 DUAL 4-INPUT LOGIC GATE EXPANDER The integrated circuit covered by this data sheet forms part of Radiation's family of 200 and 300 Series DTL circuits intended for use in ultra-high speed, low-power digital systems.

3. "NAND" Logic Definitions: " U P " Level = " 1 " , "DOWN" Level = " 0 " . 4. All measurements made with Pin 7 at zero volts. All voltage and capacitance measurements are referenced to pin 7. Terminals not specifically mentioned are left electrically open. Test Circuit No. 3 t p d — measurement tPd Measured period of oscillation 12 1576 RD-208 RADIATION (Contd) I N T E G R A T E D CIRCUITS TABLE I - E N V I R O N M E N T A L SCREEN TESTS (100%) TESTS PERFORMED Heat Soak; 8 hours min. 000 6 min.

000 G min. Y, axis Temperature Cycling: 1/2 hour min. (a, + 1 5 0 ° C (3 Cycles) ELECTRICAL TESTS: 5 min max. @ + 25°C 1/2 hour min. (o> - 65°C TABLE Ii - GROUP A, TYPE ACCEPTANCE TESTS CONDITIONS LTPD M A X . ACCEPTANCE NO. 1 Temperature Cycle -65°Cto150°C MAX. MIN. UNIT MAX. ACCEPT NO. 1 Moisture Resistance End Points (Failure Criteria) B3 "0" Output Voltage Note 1, subgroup A3 "0" Input Current Note 1, subgroup A3 "1" Input Current Note 1, subgroup A3 "1" Output Current Note 1. 1 blows each in X], Y j .

Download PDF sample

Rated 4.03 of 5 – based on 45 votes